By Chugui, Y.
This detailed assortment makes a speciality of size technological know-how and metrology: micro- and nano- measurements; novel size tools and diagnostic applied sciences, together with non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz applied sciences for technology, and biomedicine, clever measuring tools and structures for and delivery, measurements of geometrical and mechanical amounts, measurements and metrology for humanitarian fields and schooling in size technology. the purpose used to be to provide the present nation and evolution of measuring expertise and clever tools, to focus on novel applied sciences for technological know-how, and engineering, and to identify promising methods in the direction of additional improvement, of recent applied sciences for dimension, on the overseas point.
Read or Download Measurement Technology and Intelligent Instruments IX: Selected Papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia PDF
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Additional info for Measurement Technology and Intelligent Instruments IX: Selected Papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia
Example text
F. R. Huffman: Absorption and Scattering of Light by Small Particles (John Wiley & Sons, New York, 1983). W. Goodman: Statistical Optics (Wiley, 2000). 30 Measurement and Visualization of Dynamics of Piezoelectric Microcantilever Weijie Dong 1, a, Mengwei Liu 2,b and Cui Yan 3,c 1 Dept. cn Keywords: Piezoelectric, Microcantilever, Dynamics, Natural Frequency, Visualization Abstract. 5)O3 microcantilever are investigated. Considering the two-segment structure of the microcantilever, a self-exiting self-sensing method is proposed to obtain the fundamental resonant frequency.
The method also provides the opportunity to carry out measurements for different scattering angles simultaneously and offers a way of recognizing speckle pattern transformations caused by harmonic, translatory and Brownian motions of particles, and allows one to register influence of uncontrolled forces such as monochromatic and broadband acoustic fields upon particles size measurements results. The method allows one to measure particles diameters from 30 to 750 nm with measurement error less then 10%.
8 kHz. 8 kHz, the size of light spot became smaller. 8 kHz. 3 kHz. (a) far from resonance (b) near to resonance (c) at resonance Fig. 6. Pictures of microcantilever sample #1 at frequency approaching first resonance Second Resonant Frequency Determination Microcantilever sample #2 was chosen to demonstrate the proposed method in visualizing high resonance. The test process was the same as above, but the sweeping frequency reached 90 kHz. Three typical pictures are shown in Fig. 9 kHz. Conclusion Two methods for measuring and visualizing the first and second resonances are described.